SIMPLE ERROR TREATMENT IN COMPUTERIZED DECONVOLUTION OF X-RAY-DIFFRACTION LINE-PROFILES

被引：0

作者：

DELHEZ, R ^{[1
]}

MITTEMEIJER, EJ ^{[1
]}

VANDENBERGEN, EA ^{[1
]}

机构：

[1] DELFT UNIV TECHNOL,LAB MET,DELFT,NETHERLANDS

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1975年 / 31卷

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：S203 / S203

页数：1

共 50 条

[41] APPLICATION OF VARIANCE ANALYSIS TO X-RAY-DIFFRACTION PROFILES OF POLYMERS
WILSON, AJC
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1972, 5 (JUL1) : 300 - &
[42] DETERMINATION OF THE DEVIATIONS IN MULTILAYERS FROM X-RAY-DIFFRACTION PROFILES
HE, XC
SHEN, HS
YUAN, XY
WU, ZQ
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1991, 308 (1-2): : 375 - 377
[43] Deconvolution of X-ray diffraction profiles by using series expansion
Sánchez-Bajo, F
Cumbrera, FL
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2000, 33 : 259 - 266
[44] SIMPLE PHOTOGRAPHIC METHOD FOR X-RAY-DIFFRACTION CHARACTERIZATION OF SUPERLATTICES
WILLIAMS, GVM
TRODAHL, HJ
MARCH, RH
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1988, 21 (06): : 601 - 603
[45] PITFALLS IN THE EVALUATION OF X-RAY-DIFFRACTION LINE-SHAPE
ZORN, G
AUSTRALIAN JOURNAL OF PHYSICS, 1988, 41 (02): : 237 - 249
[46] A DIRECT METHOD OF CORRECTION OF X-RAY DIFFRACTION LINE PROFILES .1. NUMERIC DECONVOLUTION METHOD
LOUER, D
WEIGEL, D
LOUBOUTI.R
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 335 - &
[47] STRUCTURAL STUDIES OF POLYSACCHARIDES AND PROTEOGLYCANS USING X-RAY-DIFFRACTION AND COMPUTERIZED MODELING
ATKINS, E
HOPPE-SEYLERS ZEITSCHRIFT FUR PHYSIOLOGISCHE CHEMIE, 1984, 365 (09): : 962 - 962
[48] APPLICATION OF A TERNARY CONVOLUTION IN APPROXIMATING THE SHAPE OF X-RAY-DIFFRACTION PROFILES
KAGAN, AS
SHISHLYANNIKOVA, LM
UNIKEL, AP
INDUSTRIAL LABORATORY, 1980, 46 (10): : 1018 - 1021
[49] NOTE ON KINEMATICAL THEORY OF X-RAY-DIFFRACTION FROM CONCENTRATION PROFILES
MITTEMEIJER, EJ
DELHEZ, R
JOURNAL OF APPLIED PHYSICS, 1976, 47 (04) : 1702 - 1703
[50] DETERMINATION OF CONCENTRATION PROFILES IN INHOMOGENEOUS ALLOYS BY MEANS OF X-RAY-DIFFRACTION
WAGENDRI.A
WOLF, D
ZEITSCHRIFT FUR METALLKUNDE, 1974, 65 (10): : 660 - 663

← 1 2 3 4 5 →