FLUORESCENCE IMAGING FOR MACHINE VISION

被引:1
|
作者
CHEN, J [1 ]
TRETIAK, OJ [1 ]
机构
[1] DREXEL UNIV,DEPT ELECT & COMP ENGN,PHILADELPHIA,PA 19104
来源
APPLIED OPTICS | 1992年 / 31卷 / 11期
关键词
FLUORESCENCE ILLUMINATION; MACHINE VISION; ELECTRONIC INSPECTION; THRESHOLDING;
D O I
10.1364/AO.31.001871
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Suitable illumination is a crucial aspect in the successful solution of machine vision problems. In this research we used objective image evaluation techniques and found that fluorescence imaging is superior to conventional illumination for acquiring images of integrated circuit lead bonds. This is an interesting and surprising finding, since there was no a priori reason to expect that any part of the bond would contain fluorescent components. Consequently, fluorescence imaging should be considered as an option in designing machine vision systems, especially if conventional illumination systems do not produce images of adequate quality. In this research we discovered a novel and effective method for threshold selection.
引用
收藏
页码:1871 / 1877
页数:7
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