X-RAY-DIFFRACTION STUDIES OF THIN-FILMS AND MULTILAYER STRUCTURES

被引：62

作者：

SEGMULLER, A ^{[1
]}

NOYAN, IC ^{[1
]}

SPERIOSU, VS ^{[1
]}

机构：

[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1989年 / 18卷

关键词：

D O I：

10.1016/0146-3535(89)90024-5

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：21 / 66

页数：46

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