SURFACE-STRUCTURE ANALYSIS OF SI(111)SQUARE-ROOT-3XSQUARE-ROOT-3-BI BY X-RAY-DIFFRACTION - APPROACH TO THE SOLUTION OF THE PHASE PROBLEM

被引：0
|
作者：
TAKAHASHI, T
NAKATANI, S
ISHIKAWA, T
KIKUTA, S
机构：
[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,OHO,IBARAKI 305,JAPAN
[2] UNIV TOKYO,FAC ENGN,DEPT APPL PHYS,BUNKYO KU,TOKYO 113,JAPAN
来源：
SURFACE SCIENCE | 1987年 / 191卷 / 03期
关键词：
D O I：
10.1016/0167-2584(87)90391-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：L825 / L834
页数：10
相关论文
共 50 条
  • [31] AU/SI(111) - ANALYSIS OF THE (SQUARE-ROOT 3 X SQUARE-ROOT 3)R30-DEGREES AND 6X6 STRUCTURES BY INPLANE X-RAY-DIFFRACTION
    DORNISCH, D
    MORITZ, W
    SCHULZ, H
    FEIDENHANSL, R
    NIELSEN, M
    GREY, F
    JOHNSON, RL
    PHYSICAL REVIEW B, 1991, 44 (20): : 11221 - 11230
  • [32] PHOTOELECTRON AND INVERSE PHOTOELECTRON-SPECTROSCOPY STUDIES OF THE SI(111) SQUARE-ROOT-3XSQUARE-ROOT-3-SB SURFACE
    KINOSHITA, T
    ENTA, Y
    OHTA, H
    YAEGASHI, Y
    SUZUKI, S
    KONO, S
    SURFACE SCIENCE, 1988, 204 (03) : 405 - 414
  • [33] PHOTOELECTRON DIFFRACTION STUDY OF THE ATOMIC GEOMETRY OF THE SI(111)SQUARE-ROOT-3 X SQUARE-ROOT-3-SB SURFACE
    ABUKAWA, T
    PARK, CY
    KONO, S
    SURFACE SCIENCE, 1988, 201 (03) : L513 - L518
  • [34] DIFFERENT OXIDATION BEHAVIOR OF THE SQUARE-ROOT-3XSQUARE-ROOT 3 AG AND AU ON THE SI(111) SURFACE STUDIED BY PHOTOEMISSION
    YEH, JJ
    FRIEDMAN, DJ
    CAO, R
    HWANG, J
    LINDAU, I
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1986, 191 : 215 - COLL
  • [35] RHEED INTENSITY ANALYSIS OF SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG STRUCTURE
    ICHIMIYA, A
    KOHMOTO, S
    FUJII, T
    HORIO, Y
    APPLIED SURFACE SCIENCE, 1989, 41-2 : 82 - 87
  • [36] AN X-RAY-DIFFRACTION STUDY OF THE SI(111)(ROOT-3X-ROOT-3)R30-DEGREES INDIUM RECONSTRUCTION
    FINNEY, MS
    NORRIS, C
    HOWES, PB
    VANSILFHOUT, RG
    CLARK, GF
    THORNTON, JMC
    SURFACE SCIENCE, 1993, 291 (1-2) : 99 - 109
  • [37] A NEW METHOD OF SURFACE STRUCTURE-ANALYSIS BY MEDIUM ENERGY ELECTRON-DIFFRACTION - DISTINCTION BETWEEN T(4) AND H(3) MODELS FOR THE SI(111)SQUARE ROOT-3XSQUARE-ROOT-3-IN SURFACE
    NAKAMURA, N
    ANNO, K
    KONO, S
    SURFACE SCIENCE, 1992, 262 (03) : L101 - L106
  • [38] STRUCTURE OF THE SI(111) SQUARE-ROOT-OF-3 X SQUARE-ROOT-OF-3-SB INTERFACE BY SURFACE X-RAY ABSORPTION FINE-STRUCTURE AND PHOTOEMISSION
    WOICIK, JC
    KENDELEWICZ, T
    MIYANO, KE
    BOULDIN, CE
    MEISSNER, PL
    PIANETTA, P
    SPICER, WE
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 1956 - 1961
  • [39] STUDY ON THE Si(111) ROOT 3MUL ROOT 3-Ag SURFACE STRUCTURE BY X-RAY DIFFRACTION.
    Univ of Tokyo, Roppongi, Jpn, Univ of Tokyo, Roppongi, Jpn
    Jpn J Appl Phys Part 2, 1988, 5 (753-755):
  • [40] SQUARE-ROOT-3XSQUARE-ROOT-3-B STRUCTURE ON A 5X5 GEXSI1-X/SI(111) SURFACE AND ITS ELECTRICAL-CONDUCTION
    TATSUMI, T
    HIROSAWA, I
    NIINO, T
    HIRAYAMA, H
    MIZUKI, J
    JOURNAL OF CRYSTAL GROWTH, 1991, 111 (1-4) : 961 - 964
12345