SURFACE-STRUCTURE ANALYSIS OF SI(111)SQUARE-ROOT-3XSQUARE-ROOT-3-BI BY X-RAY-DIFFRACTION - APPROACH TO THE SOLUTION OF THE PHASE PROBLEM

被引：0

作者：

TAKAHASHI, T

NAKATANI, S

ISHIKAWA, T

KIKUTA, S

机构：

[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,OHO,IBARAKI 305,JAPAN

[2] UNIV TOKYO,FAC ENGN,DEPT APPL PHYS,BUNKYO KU,TOKYO 113,JAPAN

来源：

SURFACE SCIENCE | 1987年 / 191卷 / 03期

关键词：

D O I：

10.1016/0167-2584(87)90391-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：L825 / L834

页数：10

共 50 条

[1] EVIDENCE FOR A TRIMER IN THE SQUARE-ROOT-3XSQUARE-ROOT-3-BI STRUCTURE ON THE SI(111) SURFACE BY X-RAY-DIFFRACTION UNDER THE NEARLY NORMAL INCIDENCE CONDITION
TAKAHASHI, T
IZUMI, K
ISHIKAWA, T
KIKUTA, S
SURFACE SCIENCE, 1987, 183 (1-2) : L302 - L312
[2] STUDY ON THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE-STRUCTURE BY X-RAY-DIFFRACTION
TAKAHASHI, T
NAKATANI, S
OKAMOTO, N
ISHIKAWA, T
KIKUTA, S
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (05): : L753 - L755
[3] THE STRUCTURE OF THE SI(111)(SQUARE-ROOT3XSQUARE-ROOT3)R30-DEGREES-SN SURFACE DETERMINED USING X-RAY-DIFFRACTION
CONWAY, KM
MACDONALD, JE
NORRIS, C
VLIEG, E
VANDERVEEN, JF
SURFACE SCIENCE, 1989, 215 (03) : 555 - 565
[4] REFINEMENT OF THE SI(111)ROOT-3X-ROOT-3-AG STRUCTURE BY SURFACE X-RAY-DIFFRACTION
TAKAHASHI, T
NAKATANI, S
SURFACE SCIENCE, 1993, 282 (1-2) : 17 - 32
[5] UNOCCUPIED SURFACE-STATES REVEALING THE SI(111)SQUARE-ROOT-3XSQUARE-ROOT-3-AL, SI(111)SQUARE-ROOT-3XSQUARE-ROOT-3-GA, AND SI(111)SQUARE-ROOT-3XSQUARE-ROOT-3-IN ADATOM GEOMETRIES
NICHOLLS, JM
REIHL, B
NORTHRUP, JE
PHYSICAL REVIEW B, 1987, 35 (08): : 4137 - 4140
[6] A STUDY OF THE SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AG SURFACE BY TRANSMISSION-X-RAY DIFFRACTION AND X-RAY-DIFFRACTION TOPOGRAPHY
TAKAHASHI, T
NAKATANI, S
OKAMOTO, N
ISHIKAWA, T
KIKUTA, S
SURFACE SCIENCE, 1991, 242 (1-3) : 54 - 58
[7] ANALYSIS OF THE ATOMIC-STRUCTURE OF THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-BI - SURFACE BY X-RAY PHOTOELECTRON DIFFRACTION
PARK, CY
ABUKAWA, T
HIGASHIYAMA, K
KONO, S
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1987, 26 (08): : L1335 - L1337
[8] SURFACE-STRUCTURE OF SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AG STUDIED BY AVERAGED LEED ANALYSIS
TERADA, Y
YOSHIZUKA, T
OURA, K
HANAWA, T
JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (05) : L333 - L336
[9] STUDY OF THE SI(111) SQUARE-ROOT-3XSQUARE-ROOT-3-GA SURFACE BY X-RAY PHOTOELECTRON AND AUGER-ELECTRON DIFFRACTION
HIGASHIYAMA, K
KONO, S
SAGAWA, T
SURFACE SCIENCE, 1986, 175 (03) : L794 - L800
[10] THE STRUCTURE OF SI(111)-(SQUARE-ROOT-3X SQUARE-ROOT-3)R30-DEGREES-AG DETERMINED BY SURFACE X-RAY-DIFFRACTION
VLIEG, E
VANDERGON, AWD
VANDERVEEN, JF
MACDONALD, JE
NORRIS, C
SURFACE SCIENCE, 1989, 209 (1-2) : 100 - 114

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