COMPOSITIONAL CHANGE OF SILICON-CARBIDE SURFACE DUE TO OXYGEN-ADSORPTION AND HEAT-TREATMENT

被引:2
|
作者
MINAGAWA, H
VINA, RO
KADOWAKI, T
MIZUNO, S
TOCHIHARA, H
HAYAKAWA, K
TOYOSHIMA, I
机构
[1] Catalysis Research Center, Hokkaido University, Sapporo
关键词
SILICON CARBIDE; OXYGEN; OXIDATION; XPS; SURFACE SEGREGATION;
D O I
10.1143/JJAP.31.L1707
中图分类号
O59 [应用物理学];
学科分类号
摘要
The compositional change of the 6H-SiC(1010BAR) surface was studied under heat treatment and adsorption of oxygen. X-ray photoelectron spectroscopy (XPS) was used for the analysis of the depth composition profile and chemical binding state. After heat treatment, the carbon concentration of the surface was increased due to the surface segregation of the graphite type carbon. When the adsoption of oxygen was performed with heat treatment, the carbon concentration of the surface was increased, but the amount of segregated carbon was less than that of the sample after only heat treatment. The segregated carbon seemed to react with oxygen preferentialy and to desorb from the surface as a carbon monoxide or carbon dioxide.
引用
收藏
页码:L1707 / L1709
页数:3
相关论文
共 50 条
  • [41] Crystallinity of p-type porous silicon and its change with heat-treatment
    Ogata, YH
    Yasuda, R
    Tsuboi, T
    Otsuki, A
    Sakka, T
    ELECTROCHEMISTRY, 1999, 67 (12) : 1203 - 1205
  • [42] EFFECTS OF HEAT-TREATMENT IN A WET HYDROGEN ATMOSPHERE ON THE RELIABILITY OF SINTERED ALPHA-SILICON CARBIDE
    KIM, HE
    MOORHEAD, AJ
    RIU, DH
    LEE, DH
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1995, 78 (06) : 1708 - 1710
  • [43] Influence of high-temperature heat treatment in vacuum on the electrical resistance of silicon-carbide heating elements
    Polyak, V.I.
    Rossikhina, G.S.
    Kalikhman, V.L.
    Solov'ev, M.A.
    Refractories (English translation of Ogneupory), 1988, 29 (7-8): : 415 - 417
  • [44] PRECIPITATION OF A SUPERSATURATED SUBSTITUTIONAL SOLUTION OF PHOSPHORUS IN SILICON DUE TO HEAT-TREATMENT FOR PERIODS OF SECONDS
    BAYAZITOV, RM
    BORISENKO, VE
    KONOVALOV, DA
    KHAIBULLIN, IB
    YUDIN, SG
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1987, 21 (08): : 917 - 918
  • [45] BEHAVIOR OF OXYGEN IN THE CRYSTAL-FORMATION AND HEAT-TREATMENT OF SILICON HEAVILY DOPED WITH ANTIMONY
    NOZAKI, T
    ITOH, Y
    MASUI, T
    ABE, T
    JOURNAL OF APPLIED PHYSICS, 1986, 59 (07) : 2562 - 2565
  • [46] REVERSE DIFFUSION OF GOLD AND IRON IN SILICON DURING HEAT-TREATMENT IN OXYGEN + CHLORINE MEDIUM
    MOISEENKOVA, TV
    SVISTELNIKOVA, TP
    STUK, AA
    ALONTSEV, SA
    KHARCHENKO, VA
    INORGANIC MATERIALS, 1990, 26 (01) : 1 - 3
  • [47] CHANGE OF ADSORPTION STATE OF WATER ON ZINC-OXIDE FINE PARTICLES BY HEAT-TREATMENT
    OHKUMA, N
    UCHIDA, S
    MIZUTANI, N
    KATO, M
    NIPPON KAGAKU KAISHI, 1986, (12) : 1736 - 1741
  • [48] INFLUENCE OF HEAT-TREATMENT ON THE LIFETIME OF THE MINORITY-CARRIERS IN OXYGEN-DOPED SILICON
    GLINCHUK, KD
    LITOVCHENKO, NM
    SALNIK, ZA
    SKRYL, SI
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1985, 19 (02): : 213 - 214
  • [49] EFFECT OF HEAT-TREATMENT ON THE MINORITY-CARRIER LIFETIME IN OXYGEN-CONTAINING SILICON
    GLINCHUK, KD
    LITOVCHENKO, NM
    SALNIK, ZA
    SKRYL, SI
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 79 (02): : K159 - K163
  • [50] Work function change of fresh scratched silicon surface due to gas adsorption
    Nakayama, K
    Zhang, LL
    SURFACE AND INTERFACE ANALYSIS, 2000, 30 (01) : 643 - 645