OBSERVATION OF SURFACE-DIFFUSION BY BIASED SECONDARY-ELECTRON IMAGING - THE CASE OF AG/W(110)

被引：15
|
作者：
JONES, GW [1 ]
VENABLES, JA [1 ]
机构：
[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
来源：
ULTRAMICROSCOPY | 1985年 / 18卷 / 1-4期
关键词：
D O I：
10.1016/0304-3991(85)90163-9
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：439 / 444
页数：6
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