OBSERVATION OF SURFACE-DIFFUSION BY BIASED SECONDARY-ELECTRON IMAGING - THE CASE OF AG/W(110)

被引：15
|
作者：
JONES, GW [1 ]
VENABLES, JA [1 ]
机构：
[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
来源：
ULTRAMICROSCOPY | 1985年 / 18卷 / 1-4期
关键词：
D O I：
10.1016/0304-3991(85)90163-9
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：439 / 444
页数：6
相关论文
共 32 条
  • [1] BIASED SECONDARY-ELECTRON IMAGING STUDIES OF AG/SI(111)
    DOUST, T
    METCALFE, FL
    VENABLES, JA
    ULTRAMICROSCOPY, 1989, 31 (01) : 116 - 123
  • [2] VISUALIZATION OF SUBMONOLAYERS AND SURFACE-TOPOGRAPHY BY BIASED SECONDARY-ELECTRON IMAGING - APPLICATION TO AG LAYERS ON SI AND W SURFACES
    FUTAMOTO, M
    HANBUCKEN, M
    HARLAND, CJ
    JONES, GW
    VENABLES, JA
    SURFACE SCIENCE, 1985, 150 (02) : 430 - 450
  • [3] OBSERVATION OF EXIT SURFACE SPUTTERING IN TIO2 USING BIASED SECONDARY-ELECTRON IMAGING
    CROZIER, PA
    MCCARTNEY, MR
    SMITH, DJ
    SURFACE SCIENCE, 1990, 237 (1-3) : 232 - 240
  • [4] BIASED SECONDARY-ELECTRON IMAGING IN A UHV-STEM
    HEMBREE, GG
    CROZIER, PA
    DRUCKER, JS
    KRISHNAMURTHY, M
    VENABLES, JA
    COWLEY, JM
    ULTRAMICROSCOPY, 1989, 31 (01) : 111 - 115
  • [5] BIASED SECONDARY-ELECTRON IMAGING OF MONATOMIC SURFACE STEPS ON VICINAL SI(100) IN A UHV STEM
    DRUCKER, J
    KRISHNAMURTHY, M
    HEMBREE, G
    ULTRAMICROSCOPY, 1991, 35 (3-4) : 323 - 328
  • [6] SPREADING OF PD LAYERS ON W(110) AND VICINAL PLANES BY SURFACE-DIFFUSION
    BUTZ, R
    WAGNER, H
    VAKUUM-TECHNIK, 1978, 27 (06): : 175 - 178
  • [7] SURFACE-DIFFUSION OF RH, PD, IR AND PT ON THE W(110) PLANE
    KOLACZKIEWICZ, J
    BAUER, E
    SURFACE SCIENCE, 1991, 256 (1-2) : 87 - 93
  • [8] SECONDARY-ELECTRON EMISSION PRODUCED BY SLOW-ELECTRONS INTERACTING WITH W(100) AND W(110)
    PANCHENKO, OF
    PANCHENKO, LK
    FIZIKA TVERDOGO TELA, 1993, 35 (11): : 3164 - 3166
  • [9] RECENT SURFACE STUDIES USING BIASSED SECONDARY-ELECTRON IMAGING
    PERSAUD, R
    NORO, H
    AZIM, M
    MILNE, RH
    VENABLES, JA
    SCANNING MICROSCOPY, 1994, 8 (04) : 803 - 812
  • [10] Surface determination through atomically resolved secondary-electron imaging
    Ciston, J.
    Brown, H. G.
    D'Alfonso, A. J.
    Koirala, P.
    Ophus, C.
    Lin, Y.
    Suzuki, Y.
    Inada, H.
    Zhu, Y.
    Allen, L. J.
    Marks, L. D.
    NATURE COMMUNICATIONS, 2015, 6
1234