ANGULAR-DISTRIBUTION MEASUREMENTS ON SECONDARY ELECTRONS FROM THIN EVAPORATED METAL-FILMS

Angular distributions have been measured on secondary electrons (SE) emitted by evaporated layers of Ag, Sb, Ce, Pt, Au, Pb and Bi especially for SE energies above 50 eV. It has been possible to discriminate between electrons which had undergone single and multiple scattering. The electrons of the first kind show the influence of the structure of the differential scattering cross section for primary electrons with energies 800 eV less than equivalent to E//p less than equivalent to 10 keV on the angular distribution of SE. This holds for normal as well as for oblique incidence and is in accordance with theoretical predictions.