EFFECT OF LOW-TEMPERATURE ELECTRODE BAKING ON BREAKDOWN IN VACUUM

被引:4
|
作者
YAMAMOTO, O
HARA, T
SHIMADA, M
HAYASHI, M
机构
[1] Department of Electrical Engineering, Kyoto University, Kyoto
来源
关键词
D O I
10.1109/14.231540
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Effects of electrode baking at a comparatively low temperature in vacuum have been examined. The temperature of the electrode is controlled well below the melting point of organic insulators, if installed. Currents accompanied by the microdischarges and the conditioning process during breakdown test are observed. It is shown that low temperature baking effectively suppresses the microdischarge, and that baking of the anode is more effective than baking of the cathode. It is also shown that the baking reduces the number of voltage applications which are necessary for the spark conditioning.
引用
收藏
页码:574 / 579
页数:6
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