首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
ELECTRICAL CHARACTERISTICS OF FAST RADIATIVELY PROCESSED TITANIUM SILICIDES THIN-FILMS
被引:12
|
作者
:
WEI, CS
论文数:
0
引用数:
0
h-index:
0
WEI, CS
VANDERSPIEGEL, J
论文数:
0
引用数:
0
h-index:
0
VANDERSPIEGEL, J
SANTIAGO, J
论文数:
0
引用数:
0
h-index:
0
SANTIAGO, J
机构
:
来源
:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
|
1985年
/ 3卷
/ 06期
关键词
:
D O I
:
10.1116/1.572903
中图分类号
:
TB3 [工程材料学];
学科分类号
:
0805 ;
080502 ;
摘要
:
引用
收藏
页码:2259 / 2263
页数:5
相关论文
共 50 条
[1]
CHARACTERISTICS OF THIN-FILMS OF TITANIUM-OXIDE
BLOCH, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LAUSANNE,INST PHYS EXPTL,CH-1015 LAUSANNE,SWITZERLAND
UNIV LAUSANNE,INST PHYS EXPTL,CH-1015 LAUSANNE,SWITZERLAND
BLOCH, P
STEINEMANN, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV LAUSANNE,INST PHYS EXPTL,CH-1015 LAUSANNE,SWITZERLAND
UNIV LAUSANNE,INST PHYS EXPTL,CH-1015 LAUSANNE,SWITZERLAND
STEINEMANN, S
HELVETICA PHYSICA ACTA,
1988,
61
(1-2):
: 104
-
107
[2]
DISLOCATION ENHANCED ELECTRICAL RESISTIVITY IN THIN-FILMS OF TITANIUM
HOLZ, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CHILE,DEPT FIS,CASILLA 5487,CHILE
UNIV CHILE,DEPT FIS,CASILLA 5487,CHILE
HOLZ, A
GOULD, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CHILE,DEPT FIS,CASILLA 5487,CHILE
UNIV CHILE,DEPT FIS,CASILLA 5487,CHILE
GOULD, G
THIN SOLID FILMS,
1972,
14
(01)
: 35
-
41
[3]
LASER SYNTHESIS OF THIN-FILMS OF METAL SILICIDES
DANNA, E
论文数:
0
引用数:
0
h-index:
0
机构:
Unità di Ricerca INFM, University of Lecce, Department of Physics, Lecce
DANNA, E
LEGGIERI, G
论文数:
0
引用数:
0
h-index:
0
机构:
Unità di Ricerca INFM, University of Lecce, Department of Physics, Lecce
LEGGIERI, G
LUCHES, A
论文数:
0
引用数:
0
h-index:
0
机构:
Unità di Ricerca INFM, University of Lecce, Department of Physics, Lecce
LUCHES, A
THIN SOLID FILMS,
1992,
218
(1-2)
: 95
-
108
[4]
OXIDATION OF TITANIUM THIN-FILMS
SYLWESTROWICZ, WD
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRLEIGH DICKINSON UNIV,MADISON,NJ 07940
FAIRLEIGH DICKINSON UNIV,MADISON,NJ 07940
SYLWESTROWICZ, WD
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(11)
: 1504
-
1508
[5]
THIN-FILMS OF RARE-EARTH-METAL SILICIDES
KOLESHKO, VM
论文数:
0
引用数:
0
h-index:
0
KOLESHKO, VM
BELITSKY, VVF
论文数:
0
引用数:
0
h-index:
0
BELITSKY, VVF
KHODIN, AA
论文数:
0
引用数:
0
h-index:
0
KHODIN, AA
THIN SOLID FILMS,
1986,
141
(02)
: 277
-
285
[6]
Effects of thermal treatment on the electrical behavior of titanium dioxide thin-films
V-Nino, Ely Dannier
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Ind Santander, CIMBIOS, CMN, Bucaramanga 680002, Colombia
Univ Ind Santander, CIMBIOS, CMN, Bucaramanga 680002, Colombia
V-Nino, Ely Dannier
Bertel, Linda
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Ind Santander, CIMBIOS, CMN, Bucaramanga 680002, Colombia
Univ Ind Santander, CIMBIOS, CMN, Bucaramanga 680002, Colombia
Bertel, Linda
Miranda, David A.
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Ind Santander, CIMBIOS, CMN, Bucaramanga 680002, Colombia
Univ Ind Santander, CIMBIOS, CMN, Bucaramanga 680002, Colombia
Miranda, David A.
EMERGENT MATERIALS,
2024,
7
(05)
: 2025
-
2034
[7]
ELECTRICAL-PROPERTIES OF SOL-GEL PROCESSED PLZT THIN-FILMS
KIM, JM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Ceramic Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon, Kusong Dong 373-1, Yusung Gu
KIM, JM
YOON, DS
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Ceramic Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon, Kusong Dong 373-1, Yusung Gu
YOON, DS
NO, K
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Ceramic Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon, Kusong Dong 373-1, Yusung Gu
NO, K
JOURNAL OF MATERIALS SCIENCE,
1994,
29
(24)
: 6599
-
6603
[8]
STRUCTURAL CHARACTERISTICS AND ELECTRICAL-CONDUCTIVITY OF TELLURIUM THIN-FILMS
KOLOSNITSYN, BS
论文数:
0
引用数:
0
h-index:
0
KOLOSNITSYN, BS
TROYAN, EF
论文数:
0
引用数:
0
h-index:
0
TROYAN, EF
MOZALEV, AM
论文数:
0
引用数:
0
h-index:
0
MOZALEV, AM
INORGANIC MATERIALS,
1991,
27
(09)
: 1533
-
1537
[9]
ELECTRICAL CHARACTERISTICS OF FERROELECTRIC PZT THIN-FILMS FOR DRAM APPLICATIONS
MOAZZAMI, R
论文数:
0
引用数:
0
h-index:
0
机构:
NATL SEMICOND CORP,SANTA CLARA,CA 95052
MOAZZAMI, R
HU, CM
论文数:
0
引用数:
0
h-index:
0
机构:
NATL SEMICOND CORP,SANTA CLARA,CA 95052
HU, CM
SHEPHERD, WH
论文数:
0
引用数:
0
h-index:
0
机构:
NATL SEMICOND CORP,SANTA CLARA,CA 95052
SHEPHERD, WH
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1992,
39
(09)
: 2044
-
2049
[10]
RULES FOR THE FORMATION OF SILICIDES DURING SILICIDATION OF COBALT THIN-FILMS
LABUNOV, VA
论文数:
0
引用数:
0
h-index:
0
LABUNOV, VA
BORISENKO, VE
论文数:
0
引用数:
0
h-index:
0
BORISENKO, VE
ZAROVSKII, DI
论文数:
0
引用数:
0
h-index:
0
ZAROVSKII, DI
KLUBOVICH, AV
论文数:
0
引用数:
0
h-index:
0
KLUBOVICH, AV
SOVIET MICROELECTRONICS,
1990,
19
(02):
: 85
-
88
←
1
2
3
4
5
→