EPITAXIAL-GROWTH AND CHARACTERIZATION OF ORGANIC THIN-FILMS ON SILICON

被引:47
|
作者
ZIMMERMANN, U [1 ]
SCHNITZLER, G [1 ]
KARL, N [1 ]
UMBACH, E [1 ]
DUDDE, R [1 ]
机构
[1] MAX PLANCK GESELL,FRITZ HABER INST,D-1000 BERLIN,FED REP GER
关键词
D O I
10.1016/0040-6090(89)90813-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:85 / 88
页数:4
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