NOISE SOURCE CHARACTERIZATION OF HOT JETS BY CROSSED-BEAM TECHNIQUE

被引：0
|
作者：
BELLEVAL, JFD [1 ]
MAULARD, J [1 ]
机构：
[1] OFF NATL ETUD & RECH AEROSP,PARIS,FRANCE
来源：
IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS | 1975年 / 11卷 / 05期
关键词：
D O I：
暂无
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：969 / 969
页数：1
相关论文
共 50 条
  • [21] ION-BEAM SOURCE FOR LOW-ENERGY ION-NEUTRAL CROSSED-BEAM STUDY
    MOCHIZUKI, T
    ARIKAWA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1973, 12 (01) : 1 - 6
  • [22] Pulse shaping in crossed-beam volume gratings
    Lv, Congling
    Yan, Aimin
    Hu, Zhijuan
    Zhang, Hao
    Shi, Wangzhou
    JOURNAL OF MODERN OPTICS, 2015, 62 (10) : 830 - 836
  • [23] CROSSED-BEAM STUDY OF THE DYNAMICS OF CHEMIIONIZATION REACTIONS
    CROSS, RJ
    SAUNDERS, M
    ACCOUNTS OF CHEMICAL RESEARCH, 1991, 24 (04) : 104 - 109
  • [24] Pulsed reactive crossed-beam laser ablation
    Willmott, PR
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 69 (Suppl 1): : S437 - S440
  • [25] MULTIPLE CROSSED-BEAM ULTRASOUND DOPPLER VELOCIMETRY
    FOX, MD
    IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1978, 25 (05): : 281 - 286
  • [26] Crossed-beam pump-probe microscopy
    Jiang, Jun
    Warren, Warren S.
    Fischer, Martin C.
    OPTICS EXPRESS, 2020, 28 (08): : 11259 - 11266
  • [27] Theoretical study for detection of defects in weakly absorbing samples by crossed-beam photothermal technique
    Li, BC
    Zhang, SY
    REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 17A AND 17B, 1998, : 477 - 484
  • [28] CROSSED-BEAM LIQUID CHROMATOGRAPH MASS SPECTROMETER COMBINATION
    BLAKLEY, CR
    MCADAMS, MJ
    VESTAL, ML
    JOURNAL OF CHROMATOGRAPHY, 1978, 158 (OCT): : 261 - 276
  • [29] Impact of the Langdon effect on crossed-beam energy transfer
    David Turnbull
    Arnaud Colaïtis
    Aaron M. Hansen
    Avram L. Milder
    John P. Palastro
    Joseph Katz
    Christophe Dorrer
    Brian E. Kruschwitz
    David J. Strozzi
    Dustin H. Froula
    Nature Physics, 2020, 16 : 181 - 185
  • [30] ULTRASENSITIVE ANALYSIS WITH THE CROSSED-BEAM THERMAL LENS.
    Nolan, Thomas G.
    Dovichi, Norman J.
    IEEE Circuits and Devices Magazine, 1986, 2 (01): : 54 - 56
12345