APPLICATION OF THE ANALYTICAL ELECTRON-MICROSCOPE TO THICKNESS MEASUREMENT

被引：0
|
作者：
HORITA, Z [1 ]
ICHITANI, K [1 ]
SANO, T [1 ]
NEMOTO, M [1 ]
机构：
[1] KYUSHU UNIV,FAC ENGN,DEPT METAL,FUKUOKA 812,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1988年 / 37卷 / 05期
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中图分类号：
TH742 [显微镜];
学科分类号：
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页码：259 / 260
页数：2
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