APPLICATION OF THE ANALYTICAL ELECTRON-MICROSCOPE TO THICKNESS MEASUREMENT

被引：0

作者：

HORITA, Z ^{[1
]}

ICHITANI, K ^{[1
]}

SANO, T ^{[1
]}

NEMOTO, M ^{[1
]}

机构：

[1] KYUSHU UNIV,FAC ENGN,DEPT METAL,FUKUOKA 812,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1988年 / 37卷 / 05期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：259 / 260

页数：2

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