X-RAY AND UV DIAGNOSTICS OF LASER-PRODUCED PLASMAS

被引：0
|
作者：
BURKHALT.PG [1 ]
DOSCHEK, GA [1 ]
FELDMAN, U [1 ]
KLEIN, BM [1 ]
NAGEL, DJ [1 ]
机构：
[1] USN,RES LAB,WASHINGTON,DC 20375
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 1974年 / QE10卷 / 09期
关键词：
D O I：
10.1109/JQE.1974.1068393
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：715 / 715
页数：1
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