共 50 条
- [2] STANDARD MATERIALS FOR SECONDARY ION MASS-SPECTROMETRY JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR, 1986, 41 (12): : 1534 - 1543
- [4] SURFACE ANALYSIS OF INSULATING MATERIALS BY SECONDARY ION MASS-SPECTROMETRY (SIMS) APPLIED PHYSICS, 1976, 10 (04): : 317 - 324
- [5] DISTINCTION OF OXYGEN AND SULFUR IN SECONDARY ION MASS-SPECTROMETRY JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (09): : L734 - L735
- [7] SEMIQUANTITATIVE ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (03): : 285 - 290
- [9] SECONDARY ION MASS-SPECTROMETRY CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1974, 24 (04): : C396 - 397
- [10] SECONDARY ION MASS-SPECTROMETRY JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1982, 7 (03): : A50 - A50