X-RAY SPECTRAL MICROANALYSIS OF ANTIMONY TELLURIDE SINGLE-CRYSTALS DOPED WITH TIN AND THALLIUM

被引：0

|

作者：

MAVLONOV, S

SHEROV, PN

机构：

来源：

INORGANIC MATERIALS | 1986年 / 22卷 / 01期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：44 / 47

页数：4

相关论文

共 50 条

[31] X-RAY TOPOGRAPHIC EXAMINATION OF LARGE PARAFFIN SINGLE-CRYSTALS
GREEN, RE
FARABAUGH, EN
CRISSMAN, JM
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (03): : 283 - 283
[32] X-RAY OBSERVATIONS OF ORIENTATIONS OF PHOTODIMER IN SINGLE-CRYSTALS OF ANTHRACENE
JULIAN, MM
JOURNAL OF THE CHEMICAL SOCIETY-DALTON TRANSACTIONS, 1972, (04): : 558 - &
[33] X-RAY SPECTROMETER FOR EXAMINING STRUCTURAL DEFECTS IN SINGLE-CRYSTALS
SKUPOV, VD
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1981, 24 (01) : 240 - 242
[34] DIFFRACTION OF SPATIALLY NONUNIFORM X-RAY BEAMS BY SINGLE-CRYSTALS
SUVOROV, EV
NIKITENK.VI
POLOVINK.VI
SOVIET PHYSICS SOLID STATE,USSR, 1972, 13 (09): : 2253 - &
[35] ANOMALOUS TRANSMISSION OF X-RAY IN SILICON SINGLE-CRYSTALS WITH DISLOCATIONS
SHEIKHET, EG
VESELOVS.NV
EFIMOV, ON
FIZIKA TVERDOGO TELA, 1972, 14 (01): : 272 - &
[36] X-RAY STUDIES OF BORON IMPLANTED GERMANIUM SINGLE-CRYSTALS
REK, Z
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 61 (02): : 693 - 700
[37] ELECTROPHYSICAL PROPERTIES OF BISMUTH TELLURIDE SINGLE-CRYSTALS DOPED WITH CHROMIUM
SHEROV, PN
INORGANIC MATERIALS, 1993, 29 (02) : 299 - 300
[38] PROPERTIES OF GERMANIUM SINGLE-CRYSTALS HEAVILY DOPED WITH TIN
SHIMIZU, H
ARAI, T
KUDO, K
JAPANESE JOURNAL OF APPLIED PHYSICS, 1973, 12 (03) : 346 - 354
[39] X-ray photoelectron spectroscopy and X-ray electron-microprobe analysis of single crystals based on bismuth telluride
Gasenkova, IV
Chubarenko, VA
Tyavlovskaya, EA
Svechnikova, TE
SEMICONDUCTORS, 2003, 37 (06) : 636 - 640
[40] X-ray photoelectron spectroscopy and X-ray electron-microprobe analysis of single crystals based on bismuth telluride
I. V. Gasenkova
V. A. Chubarenko
E. A. Tyavlovskaya
T. E. Svechnikova
Semiconductors, 2003, 37 : 636 - 640

← 1 2 3 4 5 →