A 90NS 1MB DRAM WITH MULTI-BIT TEST MODE

被引：0
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作者：
KUMANOYA, M
FUJISHIMA, K
TSUKAMOTO, K
NISHIMURA, Y
SAITO, K
MATSUKAWA, T
YOSHIHARA, T
NAKANO, T
机构：
来源：
ISSCC DIGEST OF TECHNICAL PAPERS | 1985年 / 28卷
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：240 / 241
页数：2
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