DETECTABILITY OF IMPURITY ATOMS IN A THIN SURFACE-LAYER BY AN ELECTRON-MICROPROBE ANALYZER

被引：1

作者：

WARMINSKI, T ^{[1
]}

机构：

[1] POLISH ACAD SCI,INST PHYS,WARSAW 42,POLAND

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1976年 / 34卷 / 02期

关键词：

D O I：

10.1002/pssa.2210340251

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K119 / K123

页数：5

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