DETECTABILITY OF IMPURITY ATOMS IN A THIN SURFACE-LAYER BY AN ELECTRON-MICROPROBE ANALYZER

被引：1
|
作者：
WARMINSKI, T [1 ]
机构：
[1] POLISH ACAD SCI,INST PHYS,WARSAW 42,POLAND
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1976年 / 34卷 / 02期
关键词：
D O I：
10.1002/pssa.2210340251
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：K119 / K123
页数：5
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