ACCOUNT OF PAIR-BY-PAIR BOND INTERACTION IN CALCULATIONS OF THE PROPERTIES OF ALKANES

被引：0
|
作者：
SEIFER, AL
SMOLENSKII, FA
机构：
来源：
ZHURNAL FIZICHESKOI KHIMII | 1964年 / 38卷 / 09期
关键词：
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：2230 / 2234
页数：5
相关论文
共 50 条
  • [41] The influence of the form of the interaction potential on the properties of pair distribution functions
    Efimov, GV
    Nogovitsyn, EA
    RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY, 2002, 76 (11): : 1877 - 1880
  • [42] Pair interaction of excimer of pentyloxycyanobiphenyl
    Ryzhov, VN
    Gurjev, KI
    Melnichenko, NN
    SARATOV FALL MEETING 2000: LASER PHYSICS AND PHOTONICS; AND SPECTROSCOPY AND MOLECULAR MODELING, 2001, 4243 : 209 - 212
  • [43] PAIR INTERACTION - HANDEDNESS DEVELOPMENT
    KOVAC, D
    STUDIA PSYCHOLOGICA, 1995, 37 (02) : 89 - 92
  • [44] The chiral biquadratic pair interaction
    Brinker, Sascha
    Dias, Manuel dos Santos
    Lounis, Samir
    NEW JOURNAL OF PHYSICS, 2019, 21 (08):
  • [45] KONDO PROBLEM IN PAIR INTERACTION
    LINDNER, U
    PHYSICA STATUS SOLIDI, 1969, 36 (02): : K113 - &
  • [46] The through-bond interaction of a sulfur lone pair with oxygenated substituents in the thiacyclohexane framework
    Andrau, L
    White, JM
    AUSTRALIAN JOURNAL OF CHEMISTRY, 2005, 58 (07) : 531 - 534
  • [47] THEORY OF EPR-SPECTRUM OF PARAMAGNETIC ION-PAIR WITH ACCOUNT OF ANTISYMMETRIC EXCHANGE INTERACTION
    CHEREPANOV, VI
    KROTKII, AI
    KRESTNIK.SE
    FIZIKA TVERDOGO TELA, 1972, 14 (08): : 2300 - +
  • [48] Ratio between π+ π--atom and free π+ π- pair production rates with account of the strong interaction in final states
    Afanasyev, L
    Voskresenskaya, O
    PHYSICS LETTERS B, 1999, 453 (3-4) : 302 - 304
  • [49] The neurobiology of pair bond formation, bond disruption, and social buffering
    Lieberwirth, Claudia
    Wang, Zuoxin
    CURRENT OPINION IN NEUROBIOLOGY, 2016, 40 : 8 - 13
  • [50] Inductance and resistance calculations for a pair of rectangular conductors
    Goddard, KF
    Roy, AA
    Sykulski, J
    IEE PROCEEDINGS-SCIENCE MEASUREMENT AND TECHNOLOGY, 2005, 152 (02) : 73 - 78
12345