ADVANCES IN NON-CONTACT THERMAL-WAVE IMAGING WITH INFRARED DETECTION

被引：0
|
作者：
DACOL, FH [1 ]
ERMERT, H [1 ]
MELCHER, RL [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
SCANNING ELECTRON MICROSCOPY | 1985年
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D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：627 / 630
页数：4
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