X-RAY-FLUORESCENCE ANALYSIS OF SILICON GERMANIUM FILMS

被引：0
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作者：
RUDNEVSKII, NK
MASHIN, NI
KALININ, YS
机构：
来源：
INDUSTRIAL LABORATORY | 1985年 / 51卷 / 12期
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暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
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页码：1116 / 1118
页数：3
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