X-RAY PHOTOELECTRON DIFFRACTION AT HIGH ANGULAR RESOLUTION

被引：44
|
作者：
OSTERWALDER, J [1 ]
STEWART, EA [1 ]
CYR, D [1 ]
FADLEY, CS [1 ]
DELEON, JM [1 ]
REHR, JJ [1 ]
机构：
[1] UNIV WASHINGTON,DEPT PHYS,SEATTLE,WA 98195
来源：
PHYSICAL REVIEW B | 1987年 / 35卷 / 18期
关键词：
D O I：
10.1103/PhysRevB.35.9859
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：9859 / 9862
页数：4
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