SPECIMEN SURFACE EFFECTS IN THICK-TARGET PIXE ANALYSIS

被引：12
|
作者：
COOKSON, JA [1 ]
CAMPBELL, JL [1 ]
机构：
[1] UNIV GUELPH,GUELPH WATERLOO PROGRAM GRAD WORK PHYS,GUELPH N1G 2W1,ONTARIO,CANADA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 216卷 / 03期
关键词：
D O I：
10.1016/0167-5087(83)90517-3
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：489 / 495
页数：7
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