FOLLOW THESE GUIDELINES TO DESIGN TESTABLE ASICS, BOARDS, AND SYSTEMS

被引：0

作者：

VENKAT, K

机构：

来源：

EDN | 1993年 / 38卷 / 17期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：117 / &

共 50 条

[1] Whose job is it to design testable ASICs?
Rincon, AM
Lackey, D
[J]. COMPUTER DESIGN, 1996, 35 (12): : 83 - &
[2] INTEGRATED METHODOLOGY FOR THE DESIGN OF ASICS AND BOARDS
LARREUR, JC
MARTIN, MJ
[J]. ELECTRICAL COMMUNICATION, 1991, 65 (02): : 183 - 187
[3] BUILD TESTABLE ASICS USING NONSTRUCTURED DESIGN TECHNIQUES
PAYNE, DJ
[J]. EDN, 1990, 35 (05) : 167 - &
[4] Experiences teaching synthesis of FPGAs and testable ASICs
Bouldin, DW
[J]. 1997 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC SYSTEMS EDUCATION - MSE'97, PROCEEDINGS: DOING MORE WITH LESS IN A RAPIDLY CHANGING ENVIRONMENT, 1997, : 85 - 86
[5] CREATING TESTABLE SMT BOARDS
TASKER, S
SEDDON, C
[J]. PROCEEDING OF THE TECHNICAL PROGRAM OF NEPCON WEST 89, VOLS 1 AND 2, 1989, : 1547 - 1553
[6] DESIGN OF EASILY TESTABLE ITERATIVE SYSTEMS
RUBIO, A
[J]. MICROPROCESSING AND MICROPROGRAMMING, 1987, 20 (1-3): : 141 - 146
[7] Design of integrated systems including MEMS and ASICs
Gilbert, JR
Bart, SF
Romanowicz, BF
[J]. ELEVENTH ANNUAL IEEE INTERNATIONAL ASIC CONFERENCE - PROCEEDINGS, 1998, : 383 - 386
[8] Design of integrated systems including MEMS and ASICs
Gilbert, JR
Bart, SF
Romanowicz, B
[J]. ELEVENTH ANNUAL IEEE INTERNATIONAL ASIC CONFERENCE - PROCEEDINGS, 1998, : 420 - 420
[9] DESIGN OF EASILY TESTABLE BIT-SLICED SYSTEMS
SRIDHAR, T
HAYES, JP
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1981, 30 (11) : 842 - 854
[10] DESIGN OF EASILY TESTABLE ITERATIVE SYSTEMS OF COMBINATIONAL CELLS
COY, W
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1979, 28 (05) : 367 - 371

← 1 2 3 4 5 →