Software versus hardware testing of microprocessors

被引：0
|
作者：
Sosnowski, Janusz [1 ]
Gawkowski, Piotr [1 ]
机构：
[1] Warsaw Univ Technol, Inst Comp Sci, Ul Nowowiejska 15-19, Warsaw, Poland
来源：
INTERNATIONAL JOURNAL OF ELECTRONICS AND TELECOMMUNICATIONS | 2009年 / 55卷 / 01期
关键词：
BIST; autotesting; test effectiveness; microprocessor testing;
D O I：
暂无
中图分类号：
TN [电子技术、通信技术];
学科分类号：
0809 ;
摘要：
The paper deals with the problem of developing built-in-self-test (BIST) in microprocessors. We outline classical approaches based on hardware implementations, show their drawbacks and present software implementations, which can increase test effectiveness. Combining these two approaches we describe possibilities of improving test observability using available on-chip mechanisms related to on-line testing and event monitoring. The presented considerations are completed with an original technique based on application driven testing.
引用
收藏
页码：31 / 46
页数：16
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