Software versus hardware testing of microprocessors

The paper deals with the problem of developing built-in-self-test (BIST) in microprocessors. We outline classical approaches based on hardware implementations, show their drawbacks and present software implementations, which can increase test effectiveness. Combining these two approaches we describe possibilities of improving test observability using available on-chip mechanisms related to on-line testing and event monitoring. The presented considerations are completed with an original technique based on application driven testing.