MAGNETIC-RESONANCE STUDIES ON CDCR2-XINXSE4 THIN-FILMS

被引：1
|
作者：
KIM, YH
BHAGAT, SM
MANHEIMER, MA
TYAGI, S
MAKSYMOWICZ, L
LUBECKA, M
机构：
[1] UNIV MARYLAND,CTR SUPERCONDUCT RES,COLL PK,MD 20742
[2] LAB PHYS SCI,COLL PK,MD 20740
[3] DREXEL UNIV,DEPT PHYS & ATMOSPHER SCI,PHILADELPHIA,PA 19104
[4] STANISLAW STASZIC UNIV MIN & MET,INST ELECTR,PL-30059 KRAKOW,POLAND
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1992年 / 28卷 / 05期
关键词：
D O I：
10.1109/20.179756
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report electron spin resonance measurements on CdCr2-xInxSe4 thin films. For x < 0.01, data spanning wide ranges of frequency and temperature show that the material is a reentrant magnetic system. The x = 0.4 compound is a spin glass and its field induced magnetization at 77 K is affected markedly by exposure to a few mW or 0.9-mu-m radiation.
引用
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页码：3195 / 3197
页数：3
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