EVALUATION OF PB0.8SN0.2TE DETECTOR FABRICATION USING SURFACE ANALYSIS

被引：8
|
作者：
LONGSHORE, R [1 ]
JASPER, M [1 ]
SUMNER, B [1 ]
LOVECCHIO, P [1 ]
机构：
[1] NIGHT VISION LAB,FT BELVOIR,VA 22060
来源：
INFRARED PHYSICS | 1975年 / 15卷 / 04期
关键词：
D O I：
10.1016/0020-0891(75)90049-4
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：311 / 315
页数：5
相关论文
共 50 条
  • [41] X-RAY PERFECTION STUDY OF PB0.8SN0.2TE CRYSTALS GROWN BY THE BRIDGMAN METHOD
    PIETSCH, U
    MUHLBERG, M
    BERGER, H
    KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1980, 15 (01): : K7 - K9
  • [42] EFFECT OF INDIUM ON THE ELECTRICAL TRANSPORT-PROPERTIES OF PB0.8SN0.2TE THIN-FILMS
    JAGADISH, C
    DAWAR, AL
    MATHUR, PC
    MATERIALS RESEARCH BULLETIN, 1988, 23 (01) : 99 - 106
  • [43] AUGER-ELECTRON SPECTROSCOPY ANALYSIS OF PB0.8SN0.2TE EPITAXIAL-FILMS ON BAF2
    KRYLIUK, ON
    GASKOV, AM
    ZLOMANOV, VP
    NOVOSELOVA, AV
    DOKLADY AKADEMII NAUK SSSR, 1986, 287 (05): : 1157 - 1160
  • [44] Pb0．8Sn0．2Te晶体高压相变的X射线衍射研究
    顾惠成
    陈良辰
    鲍忠兴
    李凤英
    高压物理学报, 1996, (03) : 68 - 69+71
  • [45] Characterization of Pb0.8Sn0.2Te films grown on KCl substrates by hot-wall epitaxy
    Abramof, E., 1600, (96):
  • [46] CARRIER-DENSITY DEPENDENCE OF THE THERMOELECTRIC-POWER OF EPITAXIAL PB0.8SN0.2TE FILMS
    BOCHKAREVA, LV
    ZIMIN, SP
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1988, 22 (04): : 421 - 423
  • [47] Trends in the kinetic and magnetic properties of Pb0.8Sn0.2Te single crystals of high structural perfection
    M. V. Radchenko
    G. V. Lashkarev
    E. I. Slyn’ko
    A. P. Malysheva
    Physics of the Solid State, 1999, 41 : 1604 - 1607
  • [48] GROWTH OF HIGH MOBILITY EPITAXIAL THIN-FILMS OF PB0.8SN0.2TE BY VACUUM EVAPORATION
    DAWAR, AL
    KUMAR, P
    PARADKAR, SK
    TANEJA, OP
    MATHUR, PC
    INFRARED PHYSICS, 1982, 22 (03): : 133 - 137
  • [49] MAGNETOPHONON RESONANCE IN N-TYPE PB0.8SN0.2TE AND N-TYPE PBTE
    MOZHAEV, EA
    GEIMAN, KI
    MATVEENKO, AV
    MASHOVETS, DV
    PARFENEV, RV
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1977, 11 (12): : 1403 - 1404
  • [50] CHARACTERIZATION OF PB0.8SN0.2TE FILMS GROWN ON KCL SUBSTRATES BY HOT-WALL EPITAXY
    ABRAMOF, E
    FERREIRA, SO
    BOSCHETTI, C
    BANDEIRA, IN
    JOURNAL OF CRYSTAL GROWTH, 1989, 96 (03) : 637 - 644
12345