TOLERATING FAULTS

被引：0
|
作者：
BRODY, K
机构：
来源：
I&CS-INDUSTRIAL AND PROCESS CONTROL MAGAZINE | 1985年 / 58卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：35 / 40
页数：6
相关论文
共 50 条
  • [31] A scenario of tolerating interaction faults between otherwise correct systems
    Nassu, Bogdan Tomoyuki
    Nanya, Takashi
    12TH PACIFIC RIM INTERNATIONAL SYMPOSIUM ON DEPENDABLE COMPUTING, PROCEEDINGS, 2006, : 371 - +
  • [32] Tolerating Permanent State Transition Faults in Asynchronous Sequential Machines
    Jung-Min Yang
    Journal of Computer Science and Technology, 2016, 31 : 1028 - 1037
  • [33] Tolerating Radiation-Induced Transient Faults in Modern Processors
    Xiaobin Li
    Jean-Luc Gaudiot
    International Journal of Parallel Programming, 2010, 38 : 85 - 116
  • [34] Automatically Tolerating Arbitrary Faults in Non-malicious Settings
    Behrens, Diogo
    Weigert, Stefan
    Fetzer, Christof
    2013 SIXTH LATIN-AMERICAN SYMPOSIUM ON DEPENDABLE COMPUTING (LADC), 2013, : 114 - 123
  • [35] MINIMUM TIME BROADCAST NETWORKS TOLERATING A LOGARITHMIC NUMBER OF FAULTS
    GARGANO, L
    VACCARO, U
    SIAM JOURNAL ON DISCRETE MATHEMATICS, 1992, 5 (02) : 178 - 198
  • [36] RDIS: Tolerating Many Stuck-At Faults in Resistive Memory
    Maddah, Rakan
    Melhem, Rami
    Cho, Sangyeun
    IEEE TRANSACTIONS ON COMPUTERS, 2015, 64 (03) : 847 - 861
  • [37] Tolerating multiple faults in WDM networks without wavelength conversion
    Sue, CC
    Yeh, JY
    Chen, YC
    Huang, CY
    TENCON 2004 - 2004 IEEE REGION 10 CONFERENCE, VOLS A-D, PROCEEDINGS: ANALOG AND DIGITAL TECHNIQUES IN ELECTRICAL ENGINEERING, 2004, : C89 - C92
  • [38] Tolerating Permanent State Transition Faults in Asynchronous Sequential Machines
    Yang, Jung-Min
    JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2016, 31 (05) : 1028 - 1037
  • [39] Tolerating Adversarial Attacks and Byzantine Faults in Distributed Machine Learning
    Wu, Yusen
    Chen, Hao
    Wang, Xin
    Liu, Chao
    Nguyen, Phuong
    Yesha, Yelena
    2021 IEEE INTERNATIONAL CONFERENCE ON BIG DATA (BIG DATA), 2021, : 3380 - 3389
  • [40] Tolerating Radiation-Induced Transient Faults in Modern Processors
    Li, Xiaobin
    Gaudiot, Jean-Luc
    INTERNATIONAL JOURNAL OF PARALLEL PROGRAMMING, 2010, 38 (02) : 85 - 116
12345