SECONDARY-ELECTRON SPECTROSCOPY IN A DEDICATED SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：7

|

作者：

BLELOCH, AL

机构：

来源：

ULTRAMICROSCOPY | 1989年 / 29卷 / 1-4期

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D O I：

10.1016/0304-3991(89)90240-4

中图分类号：

TH742 [显微镜];

学科分类号：

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页码：147 / 152

页数：6

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