INTERFEROMETRIC METHOD FOR OPTICAL-TESTING AND WAVEFRONT ERROR SENSING

被引：0
|
作者：
KORHONEN, TK
机构：
来源：
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 1984年 / 444卷
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：249 / 252
页数：4
相关论文
共 50 条
  • [31] Interferometric Wavefront Sensing System Based on Deep Learning
    Niu, Yuhao
    Gao, Zhan
    Gao, Chenjia
    Zhao, Jieming
    Wang, Xu
    APPLIED SCIENCES-BASEL, 2020, 10 (23): : 1 - 15
  • [32] REAL-TIME METHODS IN OPTICAL-TESTING INTERFEROMETRY
    SPOLACZYK, R
    ELSSNER, KE
    FRINGE 89: PROCEEDINGS OF THE 1ST INTERNATIONAL WORKSHOP ON AUTOMATIC PROCESSING OF FRINGE PATTERNS, 1989, 10 : 137 - 139
  • [33] OPTICAL-TESTING AND INSPECTION METHODOLOGY FOR MODERN INTRAOCULAR LENSES
    PORTNEY, V
    JOURNAL OF CATARACT AND REFRACTIVE SURGERY, 1992, 18 (06): : 607 - 613
  • [34] ABSOLUTE OPTICAL-TESTING - BETTER ACCURACY THAN THE REFERENCE
    WYANT, JC
    PHOTONICS SPECTRA, 1991, 25 (03) : 97 - &
  • [35] CONFERENCE REVIEW - OPTICAL-TESTING LEADS COMMUNICATIONS ADVANCES
    REITZ, PR
    LASER FOCUS WORLD, 1994, 30 (12): : 31 - 32
  • [36] OPTICAL-PARAMETERS OF PHOTOPOLYMER RHEOXANE OBTAINED BY OPTICAL-TESTING METHODS
    GERASIMOVA, LA
    APPLIED OPTICS, 1995, 34 (25): : 5571 - 5576
  • [37] A Correction Method on System Error in Null mirror During Interferometric Testing
    Chen, Xi
    Guo, Peiji
    Wang, Wei
    9TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: ADVANCED OPTICAL MANUFACTURING TECHNOLOGIES, 2019, 10838
  • [38] SPHERICAL SHAPE MEASUREMENTS USING SUBAPERTURE OPTICAL-TESTING TECHNIQUES
    DAY, RD
    LAWRENCE, GN
    PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1989, 11 (01): : 3 - 8
  • [39] OPTICAL-TESTING OF PROBABILITY DENSITIES IN QUANTUM-WELL EIGENSTATES
    MARZIN, JY
    GERARD, JM
    SPECTROSCOPY OF SEMICONDUCTOR MICROSTRUCTURES, 1989, 206 : 305 - 316
  • [40] Method of optical interference testing error separation
    Feng Y.
    Qiao X.
    Cheng H.
    Wen Y.
    Gao Y.
    Zhang H.
    Frontiers of Optoelectronics in China, 2010, 3 (4): : 382 - 386
12345