DIRECT MEASUREMENT OF THE PARAMETERS OF X-RAY DYNAMIC SCATTERING BY SILICON-CRYSTALS AT ELEVATED-TEMPERATURES

被引：0

作者：

DILBARYAN, GA

SMOLSKII, IL

ROZHANSKII, VN

机构：

来源：

FIZIKA TVERDOGO TELA | 1986年 / 28卷 / 09期

关键词：

D O I：

暂无

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：2597 / 2603

页数：7

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