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SHALLOW APPLICATIONS OF GEOPHYSICAL DIFFRACTION TOMOGRAPHY
被引:35
|
作者
:
WITTEN, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,DIV COMP & TELECOMMUN,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,DIV COMP & TELECOMMUN,OAK RIDGE,TN 37831
WITTEN, AJ
[
1
]
LONG, E
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,DIV COMP & TELECOMMUN,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,DIV COMP & TELECOMMUN,OAK RIDGE,TN 37831
LONG, E
[
1
]
机构
:
[1]
OAK RIDGE NATL LAB,DIV COMP & TELECOMMUN,OAK RIDGE,TN 37831
来源
:
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
|
1986年
/ 24卷
/ 05期
关键词
:
D O I
:
10.1109/TGRS.1986.289611
中图分类号
:
P3 [地球物理学];
P59 [地球化学];
学科分类号
:
0708 ;
070902 ;
摘要
:
引用
收藏
页码:654 / 662
页数:9
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