STUDIES OF SOLID-SURFACES AT ATOMIC RESOLUTION - ATOM-PROBE AND FIELD-ION MICROSCOPY

被引：76

|

作者：

TSONG, TT

机构：

来源：

SURFACE SCIENCE REPORTS | 1988年 / 8卷 / 3-4期

关键词：

D O I：

10.1016/0167-5729(88)90010-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：127 / 209

页数：83

相关论文

共 50 条

[1] ATOMIC PROCESSES ON SOLID-SURFACES, A PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPE INVESTIGATION
TSONG, TT
[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1987, 193 : 33 - ANYL
[2] QUANTITATIVE ATOM-PROBE AND FIELD-ION MICROSCOPE STUDIES AT ATOMIC RESOLUTION
TSONG, TT
[J]. CHEMICA SCRIPTA, 1979, 14 (1-5): : 7 - 15
[3] ATOM-PROBE FIELD-ION MICROSCOPY
LEISCH, M
[J]. MIKROCHIMICA ACTA, 1992, 107 (3-6): : 95 - 104
[4] ATOM-PROBE FIELD-ION MICROSCOPY
MULLER, EW
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (01): : 89 - &
[5] ATOM-PROBE FIELD-ION MICROSCOPY
MILLER, MK
[J]. VACUUM, 1994, 45 (6-7) : 819 - 831
[6] ATOM-PROBE FIELD-ION MICROSCOPY
TSONG, TT
[J]. PHYSICS TODAY, 1993, 46 (05) : 24 - 31
[7] PULSED-LASER ATOM-PROBE AND FIELD-ION MICROSCOPE STUDY OF SOLID-SURFACES
TSONG, TT
LIU, HM
GAO, QJ
REN, DM
LIOU, Y
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (05): : 1530 - 1534
[8] ATOMIC-STRUCTURE AND COMPOSITIONAL ANALYSIS OF SOLID-SURFACES USING PULSED-LASER TOF ATOM-PROBE AND FIELD-ION MICROSCOPY
TSONG, TT
[J]. APPLIED SURFACE SCIENCE, 1988, 33-4 : 15 - 20
[9] QUANTITATIVE SURFACE-ANALYSIS AT ATOMIC RESOLUTION, ATOM-PROBE FIELD-ION MICROSCOPY
TSONG, TT
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04): : 3397 - 3404
[10] ATOM-PROBE AND FIELD-ION MICROSCOPY OF SEMICONDUCTORS
TSONG, TT
HERMAN, M
NG, YS
[J]. ULTRAMICROSCOPY, 1979, 4 (03) : 384 - 385

← 1 2 3 4 5 →