USE OF TWO-DIMENSIONAL SINGLE ELECTRON DETECTOR FOR ELECTRON-DIFFRACTION STUDIES IN TEM

被引：1
|
作者：
FIRMANI, C [1 ]
SALAS, L [1 ]
HENRIQUEZ, R [1 ]
RUIZ, E [1 ]
GOMEZ, A [1 ]
ROMEU, D [1 ]
PEREZ, R [1 ]
CASTANO, V [1 ]
SCHABES, PS [1 ]
YACAMAN, MJ [1 ]
机构：
[1] UNIV NACL AUTONOMA MEXICO,INST FIS,MEXICO CITY 01000,DF,MEXICO
来源：
ULTRAMICROSCOPY | 1985年 / 16卷 / 01期
关键词：
D O I：
10.1016/S0304-3991(85)80011-5
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：89 / 94
页数：6
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