Two-dimensional electron detectors in quantitative TEM

被引：0
|
作者：
Weickenmeier, AL [1 ]
Nufer, S [1 ]
Nuchter, W [1 ]
Gemming, T [1 ]
Mayer, J [1 ]
机构：
[1] Max Planck Inst Met Forsch, D-70174 Stuttgart, Germany
来源：
ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION | 1998年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：185 / 186
页数：2
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