SENSITIVITY IMPROVEMENT BY STEP-BIASING IN HOLOGRAPHIC-INTERFEROMETRY - REPLY

被引：0

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作者：

HARIHARAN, P ^{[1
]}

机构：

[1] CSIRO, NATL MEASUREMENT LAB, SYDNEY 2008, AUSTRALIA

来源：

OPTICAL ENGINEERING | 1976年 / 15卷 / 03期

关键词：

D O I：

10.1117/12.7971967

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

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页码：279 / 279

页数：1

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