HIGH-TEMPERATURE X-RAY DIFFRACTOMETER USING YAG LASER-BEAM

被引：0
|
作者：
INOUE, Z [1 ]
机构：
[1] NATL INST RES INORGAN MAT,SAKURA,IBARAKI 305,JAPAN
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1984年 / 40卷
关键词：
D O I：
10.1107/S0108767384087729
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：C416 / C416
页数：1
相关论文
共 50 条
  • [41] Low temperature X-ray investigations using a Guinier diffractometer system
    Tovar, Michael
    Gurieva, Galina
    Schorr, Susan
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2018, 74 : E415 - E415
  • [42] A HIGH-TEMPERATURE X-RAY LANG CAMERA
    MIZUNO, K
    KINO, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (03): : 333 - 336
  • [43] NEUTRON AND X-RAY EXPERIMENTS AT HIGH-TEMPERATURE
    ALDEBERT, P
    REVUE DE PHYSIQUE APPLIQUEE, 1984, 19 (09): : 649 - 662
  • [44] A DEVICE FOR HIGH-TEMPERATURE X-RAY PHOTOGRAPHY
    GINDIN, EI
    PROKHVATILOV, VG
    INDUSTRIAL LABORATORY, 1958, 24 (01): : 103 - 104
  • [45] HIGH-TEMPERATURE X-RAY TOPOGRAPHY OF SILICON
    GRIENAUER, H
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (03) : C97 - +
  • [46] HIGH-TEMPERATURE PLASMA X-RAY MEASUREMENTS
    ARMISTEAD, RA
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1976, 21 (05): : 853 - 854
  • [47] X-RAY CAMERAS FOR HIGH-TEMPERATURE STUDIES
    KAPYSHEV, AG
    VENEVTSE.YN
    SOLOVEV, SP
    GORBUNOV, LA
    ZHDANOV, GS
    INDUSTRIAL LABORATORY, 1965, 30 (10): : 1577 - &
  • [48] A HIGH-TEMPERATURE X-RAY DIFFRACTION CAMERA
    GOLDSCHMIDT, HJ
    CUNNINGHAM, J
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1950, 27 (07): : 177 - 182
  • [49] HIGH-TEMPERATURE X-RAY DIFFRACTION APPARATUS
    VANVALKENBURG, A
    MCMURDIE, HF
    JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1947, 38 (04): : 415 - 418
  • [50] X-RAY SPECTROSCOPY OF HIGH-TEMPERATURE PLASMA
    PRESNYAKOV, LP
    USPEKHI FIZICHESKIKH NAUK, 1976, 119 (01): : 49 - 73
12345