ABSOLUTE MEASUREMENTS OF LATTICE SPACINGS IN SURFACE-LAYERS OF CRYSTALS

被引：5
|
作者：
GOLOVIN, AL
IMAMOV, RM
KONDRASHKINA, EA
机构：
[1] Acad of Sciences of the USSR, Inst, of Crystallography, Moscow, USSR, Acad of Sciences of the USSR, Inst of Crystallography, Moscow, USSR
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1985年 / 89卷 / 01期
关键词：
CRYSTALS - X-Ray Analysis;
D O I：
10.1002/pssa.2210890145
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The authors studied perfect InSb wafers with the surface normal parallel to left bracket 111 right bracket . The penetration depth of X-rays into the crystal in the total reflection diffraction geometry is as small as about 1 to 10 nm, which provides the means to explore the structural perfection of thin subsurface layers.
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页码：K5 / K7
页数：3
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