RAPID, HIGH-QUALITY MAJOR AND TRACE-ELEMENT ANALYSIS OF POWDERED ROCK BY X-RAY-FLUORESCENCE SPECTROMETRY

被引：65
|
作者：
ROSE, WI [1 ]
BORNHORST, TJ [1 ]
SIVONEN, SJ [1 ]
机构：
[1] UNIV OULU,SF-90570 OULU 57,FINLAND
来源：
X-RAY SPECTROMETRY | 1986年 / 15卷 / 01期
关键词：
D O I：
10.1002/xrs.1300150111
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：55 / 60
页数：6
相关论文
共 50 条
  • [41] X-RAY-FLUORESCENCE SPECTROMETRY ON VARIABLE THIN DEPOSITS OF POWDERED MATERIALS
    FRIGIERI, P
    TRUCCO, R
    X-RAY SPECTROMETRY, 1974, 3 (01) : 40 - 46
  • [42] ANALYSIS OF TRACE-ELEMENTS IN HIGH-ALLOY STEEL BY X-RAY-FLUORESCENCE SPECTROMETRY
    AKIYOSHI, T
    TSUKADA, K
    SUGIMOTO, K
    MATSUMARU, N
    TSUJI, T
    TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1991, 77 (11): : 1830 - 1836
  • [43] TRACE ANALYSIS OF HIGH-PURITY IRON BY TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
    CHEN, JS
    BERNDT, H
    KLOCKENKAMPER, R
    TOLG, G
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1990, 338 (08): : 891 - 894
  • [44] COMPARISON OF SENSITIVITIES IN TRACE-ELEMENT ANALYSIS OBTAINED BY X-RAY EXCITED X-RAY-FLUORESCENCE AND PROTON-INDUCED X-RAY-EMISSION
    SCHEER, J
    VOET, L
    WATJEN, U
    KOENIG, W
    RICHTER, FW
    STEINER, U
    NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 333 - 338
  • [45] MATRIX CORRECTIONS IN TRACE-ELEMENT ANALYSIS BY X-RAY-FLUORESCENCE - EXTENSION OF COMPTON-SCATTERING TECHNIQUE TO LONG WAVELENGTHS
    NESBITT, RW
    MASTINS, H
    STOLZ, GW
    BRUCE, DR
    CHEMICAL GEOLOGY, 1976, 18 (03) : 203 - 213
  • [46] APPLICATION OF CHELATING ION-EXCHANGE RESINS FOR TRACE-ELEMENT ANALYSIS OF GEOLOGICAL SAMPLES USING X-RAY-FLUORESCENCE
    BLOUNT, CW
    LEYDEN, DE
    THOMAS, TL
    GUILL, SM
    ANALYTICAL CHEMISTRY, 1973, 45 (07) : 1045 - 1050
  • [47] DETERMINATION OF TRACE VANADIUM IN WATER BY X-RAY-FLUORESCENCE SPECTROMETRY
    SAITOH, Y
    YONEDA, A
    MAEDA, Y
    AZUMI, T
    BUNSEKI KAGAKU, 1984, 33 (08) : 412 - 416
  • [48] X-RAY-FLUORESCENCE ANALYSIS OF POWDERED ROCK SAMPLES - DETERMINATION OF THORIUM, URANIUM, ZIRCONIUM, AND HAFNIUM
    ADAMCHUK, IP
    PACHADZHANOV, DN
    MELNIKOVA, ND
    VAINBERG, VI
    JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR, 1977, 32 (02): : 253 - 258
  • [49] QUANTITATIVE TRACE-ELEMENT ANALYSES IN THICK SAMPLES WITH HEAVY-ION-INDUCED X-RAY-FLUORESCENCE
    SHABASON, L
    COHEN, BL
    WEDBERG, GH
    CHAN, KC
    JOURNAL OF APPLIED PHYSICS, 1973, 44 (10) : 4749 - 4752
  • [50] COMPARISON OF PARTICLE AND PHOTON EXCITED X-RAY-FLUORESCENCE APPLIED TO TRACE-ELEMENT MEASUREMENTS OF ENVIRONMENTAL SAMPLES
    COOPER, JA
    NUCLEAR INSTRUMENTS & METHODS, 1973, 106 (03): : 525 - 538
12345