共 50 条
- [31] DETERMINATION OF LOCATION OF OXYGEN IMPLANTED IN SILICON LATTICE SOVIET PHYSICS SEMICONDUCTORS-USSR, 1977, 11 (07): : 829 - 830
- [33] NEW ABSOLUTE PIJ METHOD FOR DETERMINATION OF LATTICE-PARAMETERS KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1979, 14 (01): : 129 - 131
- [34] CHANGE OF THE D-SPACING IN CELLULOSE CRYSTALS DURING LATTICE IMAGING ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1985, 190 (SEP): : 27 - CEL
- [36] DETERMINATION OF THE LATTICE SPACING OF SILVER BROMIDE FOR VARYING X-RAY EXPOSURES PHYSICAL REVIEW, 1947, 71 (02): : 142 - 142
- [37] Absolute determination of cross sections for resonant Raman scattering on silicon PHYSICAL REVIEW A, 2006, 74 (01):
- [38] Absolute chirality determination and asymmetric induction at a silicon surface. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 219 : U292 - U292
- [40] DETERMINATION OF POSITIONS OF INTERSTITIAL NA ATOMS IN SILICON LATTICE FIZIKA TVERDOGO TELA, 1973, 15 (01): : 180 - 183