INFLUENCE OF ION-BOMBARDMENT ON DEPTH RESOLUTION IN AUGER-ELECTRON SPECTROSCOPY ANALYSIS OF THIN GOLD-FILMS ON NICKEL

被引：64

作者：

MATHIEU, HJ ^{[1
]}

MCCLURE, DE ^{[1
]}

LANDOLT, D ^{[1
]}

机构：

[1] SWISS FED INST TECHNOL,DEPT MAT,CH-1007 LAUSANNE,SWITZERLAND

来源：

THIN SOLID FILMS | 1976年 / 38卷 / 03期

关键词：

D O I：

10.1016/0040-6090(76)90007-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：281 / 294

页数：14

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