COMPUTER-PROGRAM XPSFIT FOR ESTIMATING THE BINDING STATE IN ATOMS OF SOLID MATERIALS FROM X-RAY PHOTOELECTRON-SPECTROSCOPY (CORE-LEVEL XPS)

被引：5
|
作者：
FANTER, D
POSSART, W
机构：
[1] Institute for Applied Materials Research, Branch Teltow, Fraunhofer Society, Teltow, O-1530
来源：
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1992年 / 344卷 / 4-5期
关键词：
D O I：
10.1007/BF00322710
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
A program was developed for IBM-compatible personal computers to separate the peaks of XPS spectra using a Gauss/Lorentz product or a Gauss/Doniach-Sunic model function, The background is removed by common methods.
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页码：199 / 202
页数：4
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