COMPUTER-PROGRAM XPSFIT FOR ESTIMATING THE BINDING STATE IN ATOMS OF SOLID MATERIALS FROM X-RAY PHOTOELECTRON-SPECTROSCOPY (CORE-LEVEL XPS)

被引：5
|
作者：
FANTER, D
POSSART, W
机构：
[1] Institute for Applied Materials Research, Branch Teltow, Fraunhofer Society, Teltow, O-1530
来源：
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1992年 / 344卷 / 4-5期
关键词：
D O I：
10.1007/BF00322710
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
A program was developed for IBM-compatible personal computers to separate the peaks of XPS spectra using a Gauss/Lorentz product or a Gauss/Doniach-Sunic model function, The background is removed by common methods.
引用
收藏
页码：199 / 202
页数：4
相关论文
共 50 条
  • [1] CORE-LEVEL LIFETIMES AS DETERMINED BY X-RAY PHOTOELECTRON-SPECTROSCOPY MEASUREMENTS
    FUGGLE, JC
    ALVARADO, SF
    PHYSICAL REVIEW A, 1980, 22 (04) : 1615 - 1624
  • [2] XPS (X-RAY PHOTOELECTRON-SPECTROSCOPY) IN STUDY OF MINERAL MATERIALS
    DILLARD, JG
    KOPPELMAN, MH
    TRANSACTIONS-AMERICAN GEOPHYSICAL UNION, 1975, 56 (12): : 1004 - 1004
  • [3] CORE LEVEL X-RAY PHOTOELECTRON-SPECTROSCOPY OF AUXGAY ALLOYS
    JAYNE, DT
    FATEMI, NS
    WEIZER, VG
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 2802 - 2805
  • [4] X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS) ANALYSIS OF OXIDE SOLID-SOLUTIONS
    CIMINO, A
    MATERIALS CHEMISTRY AND PHYSICS, 1985, 13 (3-4) : 221 - 241
  • [5] SEMICONDUCTOR CORE-LEVEL TO VALENCE-BAND MAXIMUM BINDING-ENERGY DIFFERENCES - PRECISE DETERMINATION BY X-RAY PHOTOELECTRON-SPECTROSCOPY
    KRAUT, EA
    GRANT, RW
    WALDROP, JR
    KOWALCZYK, SP
    PHYSICAL REVIEW B, 1983, 28 (04): : 1965 - 1977
  • [6] Valence and Core-Level X-ray Photoelectron Spectroscopy of a Liquid Ammonia Microjet
    Buttersack, Tillmann
    Mason, Philip E.
    McMullen, Ryan S.
    Martinek, Tomas
    Brezina, Krystof
    Hein, Dennis
    Ali, Hebatallah
    Kolbeck, Claudia
    Schewe, Christian
    Malerz, Sebastian
    Winter, Bernd
    Seidel, Robert
    Marsalek, Ondrej
    Jungwirth, Pavel
    Bradforth, Stephen E.
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2019, 141 (05) : 1838 - 1841
  • [7] THE CONTRIBUTION OF CHARACTERISTIC ENERGY-LOSSES IN THE CORE-LEVEL X-RAY PHOTOELECTRON-SPECTROSCOPY PEAKS OF TIN AND (TI, AL)N STUDIED BY ELECTRON-ENERGY LOSS SPECTROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY
    STRYDOM, IL
    HOFMANN, S
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1991, 56 (02) : 85 - 103
  • [8] CORE LEVEL AND VALENCE BAND X-RAY PHOTOELECTRON-SPECTROSCOPY OF GOLD OXIDE
    AITA, CR
    TRAN, NC
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 1498 - 1500
  • [9] TETRAOSMIUM CARBONYL CLUSTERS - AN X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS) STUDY OF VALENCE AND CORE LEVELS
    ZANONI, R
    PUGA, J
    JOURNAL OF MOLECULAR STRUCTURE, 1990, 240 : 89 - 94
  • [10] Consequences of x-ray absorption fine structure for quantitative core-level photoelectron spectroscopy
    Karolewski, MA
    SURFACE AND INTERFACE ANALYSIS, 2003, 35 (02) : 199 - 204
12345