MACLE DISLOCATION OBSERVED WITH HIGH-RESOLUTION ELECTRON-MICROSCOPE

被引:6
|
作者
SCHIFFMACHER, G
CARO, PE
BOULESTEIX, C
机构
[1] CNRS,TERRES RARES LAB,F-92190 MEUDON BELLEVUE,FRANCE
[2] FAC SCI TUNIS,TUNIS,TUNISIA
来源
关键词
D O I
10.1002/pssa.2210330150
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:K9 / &
相关论文
共 50 条
  • [31] A HIGH-RESOLUTION ELECTRON-MICROSCOPE STUDY OF NICKEL TITANIUM MARTENSITE
    KNOWLES, KM
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 45 (03): : 357 - 370
  • [32] BACTERIAL SURFACES AS REVEALED BY HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE
    AMAKO, K
    UMEDA, A
    JOURNAL OF GENERAL MICROBIOLOGY, 1977, 98 (JAN): : 297 - 299
  • [33] IMAGE-FORMATION THEORY OF HIGH-RESOLUTION ELECTRON-MICROSCOPE
    ISHIZUKA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (02): : 97 - 97
  • [34] PRINCIPLES AND PERFORMANCE OF A 600 KV HIGH-RESOLUTION ELECTRON-MICROSCOPE
    COSSLETT, VE
    PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1980, 370 (1740): : 1 - &
  • [35] HIGH-RESOLUTION ELECTRON-MICROSCOPE STRUCTURE IMAGES OF METAL PARTICLES
    BOVIN, JO
    MALM, JO
    ACTA CHEMICA SCANDINAVICA, 1991, 45 (08): : 791 - 796
  • [36] HIGH-RESOLUTION ELECTRON-MICROSCOPE AUTORADIOGRAPHY ON NEGATIVE STAINED SPECIMENS
    MARALDI, NM
    BIAGINI, G
    SIMONI, P
    LASCHI, R
    HISTOCHEMIE, 1973, 35 (01): : 67 - 74
  • [37] FOCUSING OF HIGH-RESOLUTION DARK FIELD ELECTRON-MICROSCOPE IMAGES
    COWLEY, JM
    MASSOVER, WH
    JAP, BK
    OPTIK, 1974, 40 (01): : 42 - 54
  • [38] HIGH-RESOLUTION ELECTRON-MICROSCOPE OBSERVATION OF CARBON-FIBERS
    ENDO, M
    JOURNAL OF ELECTRON MICROSCOPY, 1984, 33 (01): : 80 - 80
  • [39] HIGH-RESOLUTION ELECTRON-MICROSCOPE OBSERVATION OF SMALL GOLD CRYSTALS
    GAO, P
    GLEITER, H
    ACTA METALLURGICA, 1987, 35 (07): : 1571 - 1575
  • [40] EFFECT OF MECHANICAL STABILITY ON PERFORMANCE OF A HIGH-RESOLUTION ELECTRON-MICROSCOPE
    CHIU, W
    GLAESER, RM
    JOURNAL OF ELECTRON MICROSCOPY, 1977, 26 (02): : 181 - 182