NEW TECHNIQUE FOR ORIENTATION OF CRYSTAL FROM LAUE BACK-REFLECTION PHOTOGRAPHS

被引：0
|
作者：
RIDDHAGNI, B
ASIMOW, RM
机构：
来源：
TRANSACTIONS OF THE METALLURGICAL SOCIETY OF AIME | 1966年 / 236卷 / 12期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：1761 / +
页数：1
相关论文
共 50 条
  • [41] A SINGLE-CRYSTAL ORIENTATION TECHNIQUE USING DOUBLY EXPOSED WEISSENBERG PHOTOGRAPHS
    TANAKA, I
    YAO, M
    KAMIYA, N
    IWASAKI, H
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1994, 27 (pt 1) : 92 - 95
  • [42] CRYSTAL-STRUCTURE DETERMINATION OF AN ORGANOMETALLIC COMPOUND FROM SYNCHROTRON RADIATION LAUE DIFFRACTION PHOTOGRAPHS
    HARDING, MM
    MAGINN, SJ
    CAMPBELL, JW
    CLIFTON, I
    MACHIN, P
    ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1988, 44 : 142 - 146
  • [43] Back-reflection from a Cassegrain telescope for space-based interferometric gravitational-wave detectors
    Spector, Aaron
    Mueller, Guido
    CLASSICAL AND QUANTUM GRAVITY, 2012, 29 (20)
  • [44] Suppression of Back-Reflection From the End Face of Si3N4 Waveguide Resonator
    Feng, Changkun
    Liu, Danni
    Ni, Peiren
    Li, Hui
    Feng, Lishuang
    IEEE ACCESS, 2021, 9 : 28897 - 28903
  • [45] Resonator photonic crystal fiber optic gyro with back-reflection error suppression using biased sawtooth wave modulation technology
    Shang, Kejun
    Lei, Ming
    Fang, Yuan
    Yu, Huaiyong
    Zhang, Lizhe
    OPTICAL FIBER TECHNOLOGY, 2020, 57
  • [46] Back-reflection energy-dispersive X-ray diffraction: a novel diffraction technique with almost complete insensitivity to sample morphology
    Hansford, Graeme Mark
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2011, 44 : 514 - 525
  • [47] GEOMETRY OF INSTRUMENTAL X-RAY DIFFRACTION LINEWIDTH IN A BACK-REFLECTION FOCUSING CAMERA WITH POINT SOURCE DISPLACED FROM FOCUSING CIRCLE
    DAVYDOV, GV
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (08): : 877 - &
  • [48] DERTERMINATION OF REAL AND IMAGINARY PARTS OF A STRUCTURE FACTOR FROM DEPENDENCE OF INTEGRAL COEFFICIENT OF LAUE REFLECTION OF THICKNESS OF A CRYSTAL
    KOVEV, EK
    EFIMOV, ON
    SOVIET PHYSICS SOLID STATE,USSR, 1971, 13 (01): : 13 - +
  • [49] INTENSITY ANOMALY OF FLUORESCENT X-RAY EMISSION ACCOMPANYING LAUE CASE REFLECTION FROM A PERFECT CRYSTAL
    ANNAKA, S
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1967, 23 (02) : 372 - &
  • [50] MILLISECOND X-RAY-DIFFRACTION AND THE 1ST ELECTRON-DENSITY MAP FROM LAUE PHOTOGRAPHS OF A PROTEIN CRYSTAL
    HAJDU, J
    MACHIN, PA
    CAMPBELL, JW
    GREENHOUGH, TJ
    CLIFTON, IJ
    ZUREK, S
    GOVER, S
    JOHNSON, LN
    ELDER, M
    NATURE, 1987, 329 (6135) : 178 - 181
12345