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- [3] MATRIX EFFECTS IN TRACE ANALYSIS BY PROTON-INDUCED X-RAY-EMISSION BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1976, 21 (11): : 1324 - 1324
- [4] PROTON-INDUCED X-RAY-EMISSION SPECTROSCOPY IN ELEMENTAL TRACE ANALYSIS JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1972, 12 (01): : 373 - 373
- [5] TRACE-ELEMENT ANALYSIS BY PROTON-INDUCED X-RAY-EMISSION BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1976, 21 (11): : 1324 - 1324
- [8] SIMPLE DEPTH PROFILE DETERMINATION BY PROTON-INDUCED X-RAY-EMISSION NUCLEAR INSTRUMENTS & METHODS, 1975, 131 (02): : 381 - 384
- [10] PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03): : 487 - 499